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Trigger design to software defect analysis
Lee Eun Seo , Lee Gyeong Hwan The KIPS Transactions:PartD,
Vol. 10, No. 4, pp. 709-718,
Aug.
2003
10.3745/KIPSTD.2003.10.4.709
10.3745/KIPSTD.2003.10.4.709
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Vol. 1, 2012
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Indexing
All publications of KTCCS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTCCS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
